Characterized by the introduction of scanning electron microscopy (sem)
New materials research to a new level
In order to further enhance the level of tiangong international research and development, enhance the ability of new material research and conduct authority appraisal, recently, characterized by the national laboratory work die steel center and provincial work die steel engineering technology research center, successfully introduced a German Zeiss scanning electron microscope (SEM). The introduction of scanning electron microscopy (sem), will greatly enhance the research level of tiangong international, since then, characterized by international research center for new materials, both in hardware and software implementation is among the best in the domestic counterparts, new materials for further research and development provides a strong support, make the tico international in new materials research and added new hi-tech means.
Scanning electron microscope (sem) is a complex system, enrich the electron optical technology, vacuum technology, fine mechanical structure as well as the modern computer control technology and so on. Scanning electron microscope (sem) is a kind of multifunctional instrument, has many excellent performance, is the most versatile materials research instrument, it can be three-dimensional morphology observation and analysis, at the same time of observation of morphology, the micro area composition analysis. Scanning electron microscope (sem) using electronic and material interaction, in the sample surface must be small area, point by point line by line scan. Measured sample itself can get information such as the various physical and chemical properties, can such as morphology, composition, crystal structure and electronic structure, internal electric field or magnetic field, phase calibration, strain and so on to carry out extensive research.
Unlike ordinary optical microscope, scanning electron microscope (sem) is controlled by control the size of the scanning area magnification. If you need a higher magnification, only need to scan the smaller piece area, usually only 500 times magnification, ordinary microscope and scanning electron microscopy (sem) up to 100000 times, with out of reach for ordinary microscope magnification and the imaging quality.
